In Situ Interconnect Failure Prediction Using Canaries

IEEE Transactions on Device and Materials Reliability 2014 / 9 Vol. 14; Iss. 3

In Situ Interconnect Failure Prediction Using Canaries

Chauhan, Preeti, Mathew, Sony, Osterman, Michael, Pecht, Michael
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2014.2326184
Date:
September, 2014
File:
PDF, 1014 KB
english, 2014
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