[IEEE 2014 22nd International Conference on Pattern...

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[IEEE 2014 22nd International Conference on Pattern Recognition (ICPR) - Stockholm, Sweden (2014.8.24-2014.8.28)] 2014 22nd International Conference on Pattern Recognition - Robust Point Set Matching under Variational Bayesian Framework

Qu, Han-Bing, Li, Ji-Chao, Wang, Jia-Qiang, Xiang, Lin, Tao, Hai-Jun
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Year:
2014
Language:
english
DOI:
10.1109/ICPR.2014.20
File:
PDF, 741 KB
english, 2014
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