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In situ bending of an Au nanowire monitored by micro Laue diffraction
Leclere, Cédric, Cornelius, Thomas W., Ren, Zhe, Davydok, Anton, Micha, Jean-Sébastien, Robach, Odile, Richter, Gunther, Belliard, Laurent, Thomas, OlivierVolume:
48
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576715001107
Date:
February, 2015
File:
PDF, 680 KB
english, 2015