[ACM Press the conference - Munich, Germany (2008.03.10-2008.03.14)] Proceedings of the conference on Design, automation and test in Europe - DATE '08 - Layout-aware, IR-drop tolerant transition fault pattern generation
Lee, Jeremy, Narayan, Sumit, Kapralos, Mike, Tehranipoor, MohammadYear:
2008
Language:
english
DOI:
10.1145/1403375.1403661
File:
PDF, 251 KB
english, 2008