Silicon surface studies by means of proton backscattering and proton induced X-Ray emission
Van Der Weg, W. F., Kool, W. H., Roosendaal, H. E., Saris, F. W.Volume:
17
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337577308232621
Date:
January, 1973
File:
PDF, 641 KB
english, 1973