Copper stress migration at narrow metal finger with wide...

Copper stress migration at narrow metal finger with wide lead

Robin C.J. Wang, K.S. Chang-Liao, A.S. Oates, C.C. Lee, L.D. Chen, C.C. Chiu, Kenneth Wu
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Volume:
84
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2007.05.035
File:
PDF, 1.04 MB
english, 2007
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