An investigation of ultra low-k dielectrics with high...

An investigation of ultra low-k dielectrics with high thermal stability for integration in memory devices

E. Hong, S. Demuynck, Q.T. Le, M. Baklanov, L. Carbonell, M. Van Hove, H. Meynen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
84
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2007.05.040
File:
PDF, 501 KB
english, 2007
Conversion to is in progress
Conversion to is failed