The effects of the temperature and annealing on...

Microelectronic Engineering 2008 Vol. 85; Iss. 3

The effects of the temperature and annealing on current–voltage characteristics of Ni/n-type 6H–SiC Schottky diode

A. Sefaoğlu, S. Duman, S. Doğan, B. Gürbulak, S. Tüzemen, A. Türüt
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Volume:
85
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2007.11.005
File:
PDF, 208 KB
english, 2008
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