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Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high–low frequency capacitance and conductance methods
A. Tataroğlu, Ş. AltındalVolume:
85
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2008.07.001
File:
PDF, 235 KB
english, 2008