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Accurate analysis of parasitic current overshoot during forming operation in RRAMs
S. Tirano, L. Perniola, J. Buckley, J. Cluzel, V. Jousseaume, Ch. Muller, D. Deleruyelle, B. De Salvo, G. ReimboldVolume:
88
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2011.03.062
File:
PDF, 802 KB
english, 2011