Three-Dimensional Imaging of Dislocations and Defects in...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography

Miao, Jianwei, Chen, Chien-Chun, Scott, M. C., Ercius, Peter, Zhu, Chun, Mecklenburg, Matthew, White, Edward R., Chiu, Chin-Yi, Regan, B. C., Huang, Yu, Marks, Laurence D., Dahmen, Ulrich
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761400703x
Date:
August, 2014
File:
PDF, 1.34 MB
english, 2014
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