A new fault current-sensing scheme for fast fault...

Microelectronics Journal 2008 Vol. 39; Iss. 6

A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor

In-Hwan Ji, Min-Woo Ha, Young-Hwan Choi, Seung-Chul Lee, Chong-Man Yun, Min-Koo Han
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Volume:
39
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.mejo.2007.11.018
File:
PDF, 795 KB
english, 2008
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