Switching times variation of MOSFET devices with temperature and high-field stress
R. Habchi, C. Salame, R. El Bitar, P. MialheVolume:
39
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.mejo.2007.12.028
File:
PDF, 350 KB
english, 2008