Analysis and optimization of leakage current...

Microelectronics Journal 2008 Vol. 39; Iss. 9

Analysis and optimization of leakage current characteristics in sub-65 nm dual Vt footed domino circuits

Na Gong, Baozeng Guo, Jianzhong Lou, Jinhui Wang
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Volume:
39
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.mejo.2008.01.028
File:
PDF, 402 KB
english, 2008
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