Modelling of hot-carrier degradation and its application...

Microelectronics Journal 2009 Vol. 40; Iss. 9

Modelling of hot-carrier degradation and its application for analog design for reliability

Benoit Dubois, Jean-Baptiste Kammerer, Luc Hébrard, Francis Braun
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Volume:
40
Year:
2009
Language:
english
Pages:
7
DOI:
10.1016/j.mejo.2008.03.017
File:
PDF, 330 KB
english, 2009
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