Pseudorandom BIST for test and characterization of linear...

Pseudorandom BIST for test and characterization of linear and nonlinear MEMS

A. Dhayni, S. Mir, L. Rufer, A. Bounceur, E. Simeu
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Volume:
40
Year:
2009
Language:
english
Pages:
8
DOI:
10.1016/j.mejo.2008.05.012
File:
PDF, 764 KB
english, 2009
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