Pseudorandom BIST for test and characterization of linear and nonlinear MEMS
A. Dhayni, S. Mir, L. Rufer, A. Bounceur, E. SimeuVolume:
40
Year:
2009
Language:
english
Pages:
8
DOI:
10.1016/j.mejo.2008.05.012
File:
PDF, 764 KB
english, 2009