(Invited) Electrical Characterization and Reliability...

ECS Transactions 2013 / 03 Vol. 50; Iss. 4

(Invited) Electrical Characterization and Reliability Assessment of Double-Gate FinFETs

Young, C. D., Akarvardar, K., Matthews, K., Baykan, M. O., Pater, J., Ok, I., Ngai, T., Ang, K.-W., Minakais, M., Bersuker, G., Deora, S., Hobbs, C., Kirsch, P., Jammy, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/05004.0201ecst
Date:
March, 2013
File:
PDF, 207 KB
english, 2013
Conversion to is in progress
Conversion to is failed