ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Effect of AlGaN Barrier Thickness on the Noise of AlGaN/GaN High Electron Mobility Transistors
Yahyazadeh, Rajab, Hashempour, ZahraYear:
2011
Language:
english
DOI:
10.1149/1.3567561
File:
PDF, 190 KB
english, 2011