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Analysis of Heavy Ion Irradiation Induced Thermal Damage in SiC Schottky Diodes
Abbate, C., Busatto, G., Cova, P., Delmonte, N., Giuliani, F., Iannuzzo, F., Sanseverino, A., Velardi, F.Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2014.2387014
Date:
February, 2015
File:
PDF, 1.76 MB
english, 2015