COMBINING THE FOLDING AND TESTING FOR PROGRAMMABLE LOGIC...

COMBINING THE FOLDING AND TESTING FOR PROGRAMMABLE LOGIC ARRAYS

WEI, KAI-CHENG, LIU, BIN-DA
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Volume:
4
Language:
english
Journal:
Journal of Circuits, Systems and Computers
DOI:
10.1142/S0218126694000181
Date:
September, 1994
File:
PDF, 507 KB
english, 1994
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