Transient IR imaging of light and flexible microelectronic...

Microelectronics Reliability 2006 Vol. 46; Iss. 1

Transient IR imaging of light and flexible microelectronic devices

Z. Radivojevic, I. Kassamakov, M. Oinonen, H. Saarikko, H. Seppanen, P. Vihinen
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Volume:
46
Year:
2006
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2005.01.013
File:
PDF, 534 KB
english, 2006
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