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The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs
M.A. Exarchos, G.J. Papaioannou, J. Jomaah, F. BalestraVolume:
45
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2005.07.027
File:
PDF, 293 KB
english, 2005