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Reliability investigation and characterization of failure modes in Schottky diodes
Shivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason BarrettVolume:
46
Year:
2006
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2006.02.005
File:
PDF, 498 KB
english, 2006