Trench IGBT failure mechanisms evolution with temperature...

Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions

A. Benmansour, S. Azzopardi, J.C. Martin, E. Woirgard
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Volume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.07.049
File:
PDF, 567 KB
english, 2007
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