![](/img/cover-not-exists.png)
Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
A. Benmansour, S. Azzopardi, J.C. Martin, E. WoirgardVolume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.07.049
File:
PDF, 567 KB
english, 2007