Robustness test and failure analysis of IGBT modules during turn-off
J. Urresti-Ibañez, A. Castellazzi, M. Piton, J. Rebollo, M. Mermet-Guyennet, M. CiappaVolume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.07.097
File:
PDF, 992 KB
english, 2007