Pressure-induced tin whisker formation

Microelectronics Reliability 2008 Vol. 48; Iss. 7

Pressure-induced tin whisker formation

Tadahiro Shibutani, Qiang Yu, Masaki Shiratori, Michael G. Pecht
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Volume:
48
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2008.04.009
File:
PDF, 499 KB
english, 2008
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