Estimation of SiC JFET temperature during short-circuit...

Microelectronics Reliability 2009 Vol. 49; Iss. 9-11

Estimation of SiC JFET temperature during short-circuit operations

Mounira Berkani, Stéphane Lefebvre, Narjes Boughrara, Zoubir Khatir, Jean-Claude Faugières, Peter Friedrichs, Ali Haddouche
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Volume:
49
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2009.06.024
File:
PDF, 1.11 MB
english, 2009
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