Evaluation of hot-electron effects on critical parameter...

Microelectronics Reliability 2010 Vol. 50; Iss. 9-11

Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors

M.A. Belaïd, K. Daoud
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Volume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.07.070
File:
PDF, 739 KB
english, 2010
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