Gate delay variability estimation method for parametric yield improvement in nanometer CMOS technology
Digeorgia da Silva, André I. Reis, Renato P. RibasVolume:
50
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2010.07.071
File:
PDF, 475 KB
english, 2010