Dynamic lock-in thermography for operation mode-dependent thermally active fault localization
R. Schlangen, H. Deslandes, T. Lundquist, C. Schmidt, F. Altmann, K. Yu, A. Andreasyan, S. LiVolume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.07.082
File:
PDF, 1.04 MB
english, 2010