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Whisker mitigation measures for Sn-plated Cu for different stress tests
L. Sauter, A. Seekamp, Y. Shibata, Y. Kanameda, H. YamashitaVolume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.07.083
File:
PDF, 1.09 MB
english, 2010