The optimum fin width in p-MuGFETs with the consideration of NBTI and hot carrier degradation
Dong Wook Kim, Woo Sang Park, Jong Tae ParkVolume:
50
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2010.07.088
File:
PDF, 670 KB
english, 2010