Threshold voltage instabilities in p-channel power...

Microelectronics Reliability 2010 Vol. 50; Iss. 9-11

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress

N. Stojadinović, D. Danković, I. Manić, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, Z. Prijić
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Volume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.07.122
File:
PDF, 697 KB
english, 2010
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