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Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode
L. Dupont, J.L. Blanchard, R. Lallemand, G. Coquery, J.M. Morelle, G. Blondel, B. RouleauVolume:
50
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2010.07.127
File:
PDF, 2.04 MB
english, 2010