Charge carrier recombination and generation analysis in...

Microelectronics Reliability 2010 Vol. 50; Iss. 9-11

Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy

Anna Cavallini, Laura Polenta, Antonio Castaldini
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Volume:
50
Year:
2010
Language:
english
Pages:
9
DOI:
10.1016/j.microrel.2010.07.136
File:
PDF, 1.38 MB
english, 2010
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