Ultra-fast CAD scan chain highlighting for failure analysis...

Microelectronics Reliability 2010 Vol. 50; Iss. 9-11

Ultra-fast CAD scan chain highlighting for failure analysis assistance

M. Grützner, C. Burmer, C. Brillert
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Volume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.07.145
File:
PDF, 1.42 MB
english, 2010
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