Impact of neutron irradiation on the RF properties of...

Microelectronics Reliability 2011 Vol. 51; Iss. 2

Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer

C. Roda Neve, V. Kilchytska, J. Alvarado, D. Lederer, O. Militaru, D. Flandre, J.-P. Raskin
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Volume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2010.07.153
File:
PDF, 733 KB
english, 2011
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