Ageing defect detection on IGBT power modules by artificial...

Microelectronics Reliability 2011 Vol. 51; Iss. 2

Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition

A. Oukaour, B. Tala-Ighil, B. Pouderoux, M. Tounsi, M. Bouarroudj-Berkani, S. Lefebvre, B. Boudart
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Volume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2010.08.006
File:
PDF, 872 KB
english, 2011
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