Using S-parameter measurements to determine the threshold...

Microelectronics Reliability 2011 Vol. 51; Iss. 2

Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs

Germán Álvarez-Botero, Reydezel Torres-Torres, Roberto Murphy-Arteaga
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2011
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2010.09.001
File:
PDF, 836 KB
english, 2011
Conversion to is in progress
Conversion to is failed