Toward comprehensive reliability assessment of electronics...

Microelectronics Reliability 2011 Vol. 51; Iss. 6

Toward comprehensive reliability assessment of electronics by a combined loading approach

T.T. Mattila, M. Paulasto-Kröckel
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Volume:
51
Year:
2011
Language:
english
Pages:
15
DOI:
10.1016/j.microrel.2011.03.022
File:
PDF, 2.94 MB
english, 2011
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