Temperature behavior and modeling of ohmic contacts to Si+...

Microelectronics Reliability 2011 Vol. 51; Iss. 8

Temperature behavior and modeling of ohmic contacts to Si+ implanted n-type GaN

A. Pérez-Tomás, M. Placidi, A. Fontserè, P.M. Gammon, M.R. Jennings
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.03.023
File:
PDF, 677 KB
english, 2011
Conversion to is in progress
Conversion to is failed