Generation of reduced dynamic thermal models of electronic...

Microelectronics Reliability 2011 Vol. 51; Iss. 8

Generation of reduced dynamic thermal models of electronic systems from time constant spectra of transient temperature responses

Marcin Janicki, Jedrzej Banaszczyk, Bjorn Vermeersch, Gilbert De Mey, Andrzej Napieralski
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Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.03.028
File:
PDF, 732 KB
english, 2011
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