Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

Yan, Miaolei, De Graef, Marc, Picard, Yoosuf N., Salvador, Paul A.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614006904
Date:
August, 2014
File:
PDF, 1.83 MB
english, 2014
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