Spherical Aberration Correction in Tandem with Exit-Plane...

Microscopy and Microanalysis 2004 / 4 Vol. 10; Iss. 2

Spherical Aberration Correction in Tandem with Exit-Plane Wave Function Reconstruction: Interlocking Tools for the Atomic Scale Imaging of Lattice Defects in GaAs

Tillmann, K., Thust, A., Urban, K.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927604040395
Date:
April, 2004
File:
PDF, 2.79 MB
english, 2004
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