Control current stress technique for the investigation of...

Physica status solidi 2015 / 03 Vol. 12; Iss. 3

Control current stress technique for the investigation of gate dielectrics of MIS devices

Andreev, Vladimir V., Bondarenko, Gennady G., Maslovsky, Vladimir M., Stolyarov, Alexander A., Andreev, Dmitry V.
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Volume:
12
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201400119
Date:
March, 2015
File:
PDF, 312 KB
english, 2015
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