[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Charge Trapping Characteristics of TaYOx Gate Dielectrics on Ge under DC and AC Stressing
Mahata, Chandreswar, Bera, Milan K., Mallick, S., Majhi, B., Hota, M. K., Das, T., Verma, S., Maiti, C. K.Year:
2009
Language:
english
DOI:
10.1149/1.3122125
File:
PDF, 670 KB
english, 2009