Ex-situ and In-situ Analysis of MoVTeNb Oxide by...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Ex-situ and In-situ Analysis of MoVTeNb Oxide by Aberration-Corrected Scanning Transmission Electron Microscopy

Xu, Pinghong, Sanchez-Sanchez, Maricruz, Van Veen, Andre C., Browning, Nigel D., Lercher, Johannes A.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614002268
Date:
August, 2014
File:
PDF, 1.41 MB
english, 2014
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