Grain-size stabilization by impurities and effect on...

Materials Science and Engineering: A 2008 Vol. 483-484; Iss. none

Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films

D.S. Gianola, B.G. Mendis, X.M. Cheng, K.J. Hemker
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Volume:
483-484
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.msea.2006.12.155
File:
PDF, 495 KB
english, 2008
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