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Shear of thin polytetrafluoroethylene films on Si substrate determined by laser interferometer
Yonghe Liu, S.I.-U. Ahmed, Juergen A. SchaeferVolume:
483-484
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.msea.2006.12.173
File:
PDF, 251 KB
english, 2008