Electron and Force Microscopy Characterization of Particle...

Electron and Force Microscopy Characterization of Particle Size Effects and Surface Phenomena Associated with Individual Natural Organic Matter Fractions

Hoffman, Lee W., Chilom, Gabriela, Venkatesan, Swaminathan, Rice, James A.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614000038
Date:
April, 2014
File:
PDF, 1.37 MB
english, 2014
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